A cooperation between Messe München India and the Indian Pharma Machinery Manufacturers Association (IPMMA) will collocate events jointly representing 600+ global and Indian companies.
A new description of electron scattering in the surface layers of samples proposed by the Institute of Physical Chemistry of the Polish Academy of Sciences in Warsaw significantly speeds up materials analysis and enables a better understanding of what can really be seen in a sample.
New spectroscopy releases at Pittcon 2016, along with links to further information.
This article tells us about another: “Fast and versatile ambient surface analysis by plasma-assisted desorption/ionisation mass spectrometry”. They show that surface analysis can greatly benefit from approaches using surface–plasma interactions and that PADI shows significant promise to become a valuable and versatile tool for this.
Silver is often used as a coating on medical equipment used for chemotherapy, but this silver coating can break down drugs. With the help of XPS, researchers have found a graphene coating that will help boost the effect of chemotherapy.
The US Naval Research Laboratory has a new Local Electrode Atom Probe instrument to help in the engineering of new materials.
Super-eruptions are not the only type of eruption to be considered when evaluating hazards at volcanoes with protracted eruption histories, such as the Yellowstone (Wyoming), Long Valley (California), and Valles (New Mexico) calderas in the USA. There have been more than 23 effusive eruptions of rhyolite lava at Yellowstone since the last caldera-forming eruption ~640,000 years ago, all of similar or greater magnitude than the largest volcanic eruptions of the 20th century.
A complication and barrier to wider uptake of SIMS, especially for organic materials, is the complexity of the mass spectrum. The G-SIMS method (from gentle-SIMS) was developed to simplify the spectra and provide direct interpretation based on the physics and chemistry of the SIMS process rather than on statistical analysis techniques such as principal component analysis or library matching methods.
The purpose of this article is to give a comparative description of two methods applying ion-beam sputtering in materials research: secondary ion and neutral mass spectrometries (SIMS and SNMS). We shall illustrate the application of the latter by reports on a compositional analysis of perovskite oxides and on an investigation of nanoscaled multilayer structures.
Surface Analysis Coordinator, School of Materials, The University of Manchester, PO Box 88, Manchester, M60 1QD, UK. E-mail: [email protected], Web: personalpages.manchester.ac.uk/staff/john.walton