Products
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Semi-automatic 25 t press for pellets for FT-IR and XRF.
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HORIBA Scientific’s XGT-9000 X-ray analytical microscope simultaneously performs elemental analysis and optical observation of samples.
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McPherson’s Model 251MX has applications for water window imaging, HHG laser spectroscopy, x-ray plasma diagnostics, extreme ultraviolet lithography, optical characterisation, metrology and calibration.
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Bruker’s S” POLAR is a multi-element benchtop polarised energy dispersive x-ray fluorescence analyser for a range of applications petrochemicals.
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An entry-level handheld XRF analyser with range of calibrations and accessories.
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CAMECA’s SXFive-TACTIS brings together all the best features of CAMECA’s earlier electron probe microanalysers and adds a new dual interface.
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Princeton Instruments has introduced a range of high-speed, ultra-low-noise cameras engineered for vacuum ultraviolet and soft x-ray direct-detection applications.
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Princeton Instruments has introduced two large-format, in-vacuum CCD cameras engineered for direct detection in VUV, EUV and x-ray imaging applications.
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Hitachi has introduced the data management and storage service, ExTOPE Connect, for its range of Vulcan (LIBS) and X-MET (XRF) handheld, and LAB-X500 (XRF) benchtop industrial analysers.
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Hitachi High-Tech Analytical Science Corporation has expanded the capabilities of the X-Strata920 XRF coatings analyser to include a new high-resolution detector and a new sample stage configuration.
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Bruker’s TRACER 5g handheld XRF analyser incorporates a silicon drift detector with a graphene entrance window.
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Bruker’s new CTX™ XRF analyser weighs less than 7 kg and has a footprint of 14 cm wide.
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Fluxana’s BORAMAT automatic dosing machine is compatible with all common laboratory scales.
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XRF dies that have an auto-ejector sleeve that speeds up die manufacture.
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The ElvaX ProSpector 3 from Elvatech is the next generation of their hand-held XRF spectrometer series.
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Malvern Panalytical has introduced Epsilon 4, a benchtop XRF spectrometer developed from the Epsilon 3 series.
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The EDX-8100 energy dispersive x-ray fluorescence (ED-XRF) spectrometer incorporates a revamped semiconductor detector (SDD) with a special ultra-thin-film window material.
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EDAX’s latest revision of its APEX™ Analysis Software is available for both the Element and the Octane Elect energy dispersive spectroscopy systems.
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New software support for McPherson deep UV and soft x-ray spectrometer systems and Princeton Instruments soft x-ray cameras.
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Improvements in performance of XOS’ Petra MAX D4294 analyser in final production version.
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