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Microspot thin film thickness measurements

26 February 2021 | Product
by Ian Michael

CRAIC Technologies has introduced CRAIC FilmPro™ film thickness measurement software. This software package is designed to plug into their microspectrophotometers and controlling Lambdafire™ software. CRAIC FilmPro™ allows the user to measure the thickness of thin films of many materials on both transparent and opaque substrates rapidly and non-destructively. A complete microspot film thickness solution combines a CRAIC microspectrophotometer with the FilmPro™ software. With the addition of spectral mapping from CRAIC Technologies, film thickness maps of entire devices can be created.

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