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GaN crystal evaluation system

16 August 2021 | Product
by Ian Michael

Hamamatsu Photonics has developed a GaN (gallium nitride) crystal evaluation system, the ODPL (omnidirectional photoluminescence) measurement system C15993-01. This ODPL measurement system quantitatively evaluates the quality of GaN crystals that are currently drawing attention as a material for next-generation power semiconductors. This new system will enhance R&D efficiency to discover new ways to improve crystal quality.


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