Hamamatsu Photonics has developed a GaN (gallium nitride) crystal evaluation system, the ODPL (omnidirectional photoluminescence) measurement system C15993-01. This ODPL measurement system quantitatively evaluates the quality of GaN crystals that are currently drawing attention as a material for next-generation power semiconductors. This new system will enhance R&D efficiency to discover new ways to improve crystal quality.
