For qualitative and quantitative data correlation between electron microscope spectrometry (EDS, EBSD and electron images) and atomic force microscopy.
The Thermo Scientific Nexsa surface analysis system integrates XPS with additional techniques for correlative analysis in materials research.
Horiba Scientific’s new Uvisel Plus reference ellipsometer includes the latest generation of FastAcq technology for increased measurement accuracy.
New spectroscopy releases at Pittcon 2016, along with links to further information.
RBD Instruments have release the microCMA, compact cylindrical mirror analyser (CMA) for Auger electron spectroscopy.