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RISE system for correlative Raman

10 June 2016 | Product
by Ian Michael

WITec’s RISE system for correlative Raman–scanning electron microscopy is now compatible with Zeiss’ Merlin SEM. The combined system maintains all functions and features of a stand-alone Zeiss SEM and a WITec confocal Raman microscope. In Raman imaging mode the sample can be scanned through a range of 250 × 250 × 250 µm3. The microscope enables software-driven switching between Raman imaging and SEM, transformation of the Raman spectra into an image and the ability to overlay both images to produce the RISE image.

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