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Renishaw introduces Particle Analysis module

13 October 2020 | Product
by Ian Michael

Renishaw has introduced the Particle Analysis software module for its inVia™ confocal Raman microscope. The module automates the inVia microscope so that it can identify particles on images and then chemically analyse them using Raman spectroscopy. The software module pinpoints multiple particles for automated Raman analysis and reports the results in an easy-to-navigate format. It gives chemical information on each particle and its morphology statistics. This enables you to easily spot correlations between particle size, shape and chemistry. The new module also works with Renishaw’s Correlate™ module so that images from other microscopy systems can be used to guide Raman analyses on the inVia microscope. The Particle Analysis module rapidly and comprehensively analyses multiple particles and can be used in many applications. The Particle Analysis software is an optional module for Renishaw’s WiRE™ 5.4 software, for use with the inVia confocal Raman microscope.

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