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Imaging and spectroscopic detectors for scanning electron microscopes

13 October 2017 | Product
by Ian Michael

Horiba Scientific has introduced the Horiba CLUE Series detectors for scanning electron microscopes. This provides a scalable platform for imaging and spectroscopic analysis of nano-objects with SEM and dual SEM/FIB (focused ion beam) microscopes.

i-CLUE is a fast Cathodo-Luminescence (CL) imaging system featuring a large field of view ellipsoidal collection mirror. i-CLUE is field upgradeable to a complete spectroscopy solution, offering a first step into high sensitivity CL detection at an affordable price.

The F-CLUE rugged imaging and hyperspectral CL solution is an easy upgrade on existing configurations. It has a compact design inside (fully retractable mirror collection) and outside the specimen chamber, and its fibre-coupled spectrometer fits any microscope with a free horizontal port.

H-CLUE imaging and hyperspectral CL solution which combines a high quality parabolic mirror for DUV-VIS-NIR, direct optical coupling and a high-resolution spectrometer.

R-CLUE combines cathodoluminescence, Raman spectroscopy and photoluminescence within one compact fibre-coupled solution.