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Simultaneous WD XRF system for high-throughput analysis

14 August 2017 | Product
by Ian Michael

Rigaku has introduced the latest version of their multi-channel simultaneous wavelength dispersive X-ray fluorescence (WD XRF) spectrometer system, the Simultix 15 high-throughput WDXRF spectrometer. For over 40 years, the Rigaku Simultix simultaneous WD XRF spectrometer system has been used for elemental analysis for process control in industries that require high throughput and precision, such as steel and cement. The new Simultix 15 system was developed to meet changing needs and customer requirements across a range of industrial applications, offering improved performance, functionality and usability.

The Simultix 15 analyser has a standard 30 fixed channel configuration that can be optionally upgraded to 40 channels. The Simultix 15 spectrometer has customisable, multiple discrete and optimised elemental channels and 4 kW of X-ray tube power. All channels measure simultaneously, with no moving parts and without time delay. The Simultix 15 system can be fitted with a 48-position automatic sample changer, as well as a scanning goniometer for analysis of other elements and an X-ray diffraction (XRD) channel for phase analysis, providing added flexibility.

Among the new features are the new “RX85” synthetic multi-layer crystal (producing approximately 30% greater intensity than existing multi-layers for Be-Kα and B-Kα), an available XRD channel for quantitative analysis by XRD, and improved software featuring a quantitative analysis flow-bar popular with users of Rigaku ZSX software.

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