The Jeol JMS-T2000GC “AccuTOF™ GC-Alpha” is the sixth generation of the AccuTOF™ GC series, with new high-performance hardware that achieves three times the mass resolving power and mass measurement accuracy of the previous “AccuTOF™ GCx-plus”. This is achieved by using a new ion optics design. Additionally, the system has a wide dynamic range that is beneficial not only for quantitative analysis but also for qualitative analysis of complex mixtures. A variety of ionisation techniques—field ionisation (FI), field desorption (FD), photoionisation (PI) and chemical ionisation (CI)—are optionally available, in addition to the standard electron ionisation (EI). Two combination ion sources are also available as options: the EI/FI/FD combination ion source and the EI/PI combination ion source which allow easy switching between ionisation techniques without breaking vacuum or replacing the ion sources.
The JMS-T2000GC also features new analysis software: msFineAnalysis. This software is a new generation of automated data analysis software that provides qualitative results by combining data acquired by EI and soft ionisation (FI, CI or PI) in a simple, quick and automated way. A new two-sample comparison function provides Volcano Plots, which can visually illustrate the distinguishing components between the two samples. After determining whether there are differences, integrated analysis is performed for all components. The software also supports analysis of GC/EI data alone.