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EDX-FT-IR contaminant finder and material inspector

20 March 2017 | Product
by Ian Michael

Shimadzu, has released the first EDX-FT-IR contaminant finder/material inspector. The EDXIR-Analysis software enables integration and analysis of data acquired from both an energy dispersive X-ray fluorescence (EDX) spectrometer and a Fourier transform infrared (FT-IR) spectrophotometer. This proprietary software was developed by Shimadzu to meet the needs of users performing contaminant analysis and confirmation tests using EDX and FT-IR. For contaminant analyses, data acquired with EDX and FT-IR is integrated and analysed using the new software. Previously, a separate analysis was required. By comparing the combined data with data present in a specialised contaminant library, candidate contaminants are identified.

The new EDXIR-Analysis software runs on EDX-7000P/EDX-8000P instruments as well as on Shimadzu FT-IR systems that can be controlled using LabSolutions IR/IRsolution control workstations.

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