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Tip enhanced Raman scattering

6 October 2015 | Product
by Ian Michael

Horiba Scientific and AIST-NT now offer a solution that addresses the instrumentation concerns of tip enhanced Raman scattering (TERS). The XploRA Nano platform in the upright and side configuration, combination with AIST-NT’s SmartSPM and Horiba’s XploRA spectrometer, offers a compact (the complete set up stands on a 900 × 760 × 55 mm optical table), fully integrated and automated solution. At the recent SPIE conference in San Diego, the XploRA Nano equipped with AFM-TERS tips, showed nanoscale chemical imaging of a single carbon nanotube with a spatial resolution of 8 nm, confirmed from the section analysis of the intensity of the TERS bands.