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New X-MET 8000 analyser from Hitachi High-Tech Analytical Science

4 October 2018 | Product
by Ian Michael

Hitachi High-Tech Analytical Science has introduced a new entry-level handheld X-ray fluorescence (XRF) X-MET8000 Smart model to offer users a more competitively priced package for the X-MET brand. A large area silicon drift detector (SDD) detector allows users to pick up to three calibrations: Alloy FP, Aluminium FP and Precious FP. The instrument has a shield window as standard to protect the instrument from sharp objects, one battery that allows a full day’s operation (10–12 hours) and a power supply. Users can purchase additional accessories as needed. The X-MET8000 Smart has over 1600 grades in the built-in library and a comprehensive metals database as an option post purchase. It is robust in design, and IP54 and MIL-STD-810G standard compliant. Users also get access to advanced data management with ExTOPE Connect including mobile phone app, cloud service for data sharing and secure storage.

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