Informing Spectroscopists for Over 40 Years

Benchtop X-ray diffraction instrument

Rigaku Corporation has announced the sixth generation of their Rigaku MiniFlex benchtop X-ray diffraction (XRD) instrument. The new MiniFlex X-ray diffractometer is a multipurpose analytical instrument that can determine phase identification and quantification, percent (%) crystallinity, crystallite size and strain, lattice parameter refinement, Rietveld refinement, and molecular structure. The new MiniFlex system has increased speed and sensitivity with new technologies, including the HyPix-400 MF 2D hybrid pixel array detector (HPAD) together with an available 600 W X-ray source and new eight-position automatic sample changer. This new direct photon counting detector enables high-speed, low-noise data collection and may be operated in 0D and 1D modes for conventional XRD analysis and 2D mode for samples with coarse grain size and/or preferred orientation. A variety of X-ray tube anodes—along with a range of sample rotation and positioning accessories, together with a variety of temperature attachments—are offered to ensure coverage of a broad range of samples, whether performing research or routine quality control.

Request Information about this Product

By submitting this form you agree that we may pass this information to the company who you are enquiring about.