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Benchtop X-ray diffraction instrument

20 June 2017 | Product
by Ian Michael

Rigaku Corporation has announced the sixth generation of their Rigaku MiniFlex benchtop X-ray diffraction (XRD) instrument. The new MiniFlex X-ray diffractometer is a multipurpose analytical instrument that can determine phase identification and quantification, percent (%) crystallinity, crystallite size and strain, lattice parameter refinement, Rietveld refinement, and molecular structure. The new MiniFlex system has increased speed and sensitivity with new technologies, including the HyPix-400 MF 2D hybrid pixel array detector (HPAD) together with an available 600 W X-ray source and new eight-position automatic sample changer. This new direct photon counting detector enables high-speed, low-noise data collection and may be operated in 0D and 1D modes for conventional XRD analysis and 2D mode for samples with coarse grain size and/or preferred orientation. A variety of X-ray tube anodes—along with a range of sample rotation and positioning accessories, together with a variety of temperature attachments—are offered to ensure coverage of a broad range of samples, whether performing research or routine quality control.

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