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Benchtop TXRF spectrometer

6 October 2015 | Product
by Ian Michael

Rigaku Corporation has announced the next generation NanoHunter II benchtop total reflection X-ray fluorescence (TXRF) spectrometer that enables high-sensitivity ultra-trace elemental analysis, in liquids or on solid surfaces, to the parts-per-billion (ppb) level. The instrument combines a fully automatic optical axis adjustment system that provides stable high-sensitivity analysis in an easily handled benchtop form factor. The NanoHunter II spectrometer has a high-power 600-W X-ray source, a newly developed mirror (optic) and a large-area silicon drift detector (SDD). The lower limit of Cd detection is 2 ppb. For As and Se in a liquid, a detection lower limit of 0.8 ppb or less has been achieved. The NanoHunter II spectrometer has the necessary functionality to vary the angle of incidence, making depth profile surface analyses possible.