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Complete soil and sediment analysis with WDXRF

Photo of the Thermo Scientific ARL PERFORM’X WDXRF spectrometer

Geological samples are formed by constant deposition of inorganic and organic materials over millions of years. As the layers of deposits accumulate, the weight from the additional layers creates pressure and increased temperature creating rocks or other formation. Over time, these formations are eroded and carried away by rain, wind and snow and deposited in stream and lake beds. Analysis of these materials is of vital importance because it gives not only indications of the minerals bodies present, but also the environmental contaminates.

Analytical analysis of soil and sediment samples encompasses a vast variety of material and matrix types with many elements to be analysed having concentrations ranging from low parts per million (ppm) levels to major weight percentages of the composition. These attributes make accurate quantitative analysis ideal for wavelength dispersive X-ray fluorescence (WDXRF).

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