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Lutz Hartiga and Kristin von Czapiewskib

aEurofins, Wiertz-Eggert-Jörissen GmbH, Stenzelring 14b, 21107 Hamburg, Germany
bApplied Biosystems, Applera Deutschland GmbH, Franfurter Straße 129 B, 64293 Darmstadt, Germany

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Heidi Goenaga-Infante and Mike Sargent

LGC Limited, Queens Road, Teddington, Middlesex TW11 OLY, UK. E-mail: [email protected]

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Erwin Hoffmanna and Christian Lüdkeb

aGOS - Gesellschaft zur Förderung angewandter Optik, Optoelektronik, Quantenelektronik und Spektroskopie eV, Rudower Chaussee 29, 12489 Berlin, Germany. E-mail: [email protected]
bISAS–Institute for Analytical Sciences, Department Berlin, Albert-Einstein-Str. 9, 12489 Berlin, Germany

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Frank Rutten,* Julian Hendersona and David Briggs

School of Pharmacy and Centre for Surface Chemical Analysis,
aDepartment of Archaeology, School of Humanities, University of Nottingham, University Park, Nottingham NG7 2RD, UK
*Correspondence to: Frank Rutten, School of Pharmacy, University of Nottingham University Park, Nottingham NG7 2RD, UK. E-mail: [email protected]

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Steve Down

HD Science Limited, 16 Petworth Avenue, Toton, Nottingham NG9 6JF, UK

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In recent years, the newly-developed soft ionisation techniques together with the possibility to measure masses by high-resolution mass analysers with high transmission and with a broad mass-to-charge range have given mass spec-trometry the opportunity to add complementary information to the protein structural biology community.

Article  |  Issue 16/2 (2004)

T. Wirtz and H.-N. Migeon

Laboratoire d’Analyse des Matériaux, Centre de Recherche Public - Gabriel Lippmann, 162A, av. de la Faïencerie, L-1511 Luxembourg, [email protected]

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M. Betti , L. Aldave de las Heras



Glow Discharge Mass Spectrometry (GDMS) is one of the most powerful solid state analytical methods for the direct determination of traces, impurities and depth profiling of solids.1–5 Glow discharge mass spectrometers, which are commercially available with fast and sensitive electrical ion detection, allow direct trace elemental determination in solid materials with good sensitivity and precision in the concentration range lower than ng g–1.6

Article  |  Issue 15/3 (2003)

Dipl. Chem. FH Ch. Schanzer and Prof. Dr H.G. Bührer

Department of Chemistry, Zurich University of Applied Sciences Winterthur (ZHW), CH-8401 Winterthur, Switzerland

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