SE2008
Directory
Hiden Analytical Ltd
HORIBA Jobin Yvon
Jeol (UK) Ltd
Knight Photonics
Limited
Thermo Scientific - Scientific
Instruments
Auger
Colour and gloss
Depth profiling with ICP/MS
ESCA
Fibre optic grazing angle IR
Glow discharge OES
Layer thickness
LINA spark atomiser
LINA spark/ICP/MS
Photoemission spectroscopy (UPS,
XPS)
SIMS
SNMS
Software
Spectroscopic ellipsometry
Spin analysis in electron
spectroscopy
Total-reflection-XRF

© 2008
Spectroscopy Europe