Portable Examiner ED-XRF

The Examiner ED-XRF analyser from AppliTek has now been configured for use in soil mapping and remediation. The benchtop-type analyser can be set up at site; sample preparation is done by collecting loosened and homogenised soil samples which are put into sample cups or plastic bags. When validated with laboratory results, good agreement is evident for heavier elements such as vanadium, lead, arsenic, mercury and chromium, which originate, typically, from heavy and primary industries. Metals which are naturally present in noncontaminated soil, such as copper, zinc, calcium and iron are also included in the new “Soil” database. Fast pollutant profiling for heavy metals and their levels is possible. The analyser has been benchmarked with the relevant NIST standards.


AppliTek NV
Issue: 24-01
RSN: 118

 

User Rating: / 1
PoorBest 

Free Webinar

Free Agilent Webinar: The Inert Flow Path—Your Analyte’s Journey from Injection to Detection

Agilent GC Webinar

View this Free Webinar

camo-1

Latest Comments

  • Gujarathi Dipak B. said More...
    Sir,
    This is an excellent appl... 8 months ago
  • Rakesh Kanda said More...
    Dr Alfonso,

    Matrix suppression is ... 1 year ago
  • Dr Robson JCF Afonso said More...
    Dear Authors,

    As you sad atmospheric... 1 year ago
  • Dr Robson JCF Afonso said More...
    I am glad to hearing someone question... 2 years ago
  • Peter Jenks said More...
    That is a reason I\'d overlooked - po... 2 years ago

Contents Alerts

Receive updates whenever a new issue of Spectroscopy Europe is published. Just enter your e-mail address:

RSS Feeds

News News Products Products Webinars Webinars

Follow Spectroscopy on Twitter