The MProbe from Lambda Photometrics is a non-contact film thickness measurement system which can measure the thickness of translucent multi-layer film stacks. A family of MProbe systems is available from the UV to the IR for all thickness ranges and resolution requirements. The TFCompanion control and analysis software package allows users to build layer stack models from a materials library as well as add customised materials. Stand-alone versions of the software are available for end-users and system integrators. The system is suitable for at-line, on-line and OEM set-ups as well as academic and industrial R&D. Applications include solar cell PV coatings, polymer films, semiconductors, photoresists, thin oxide and nitride films, LCD and flat panel displays and optical coatings.

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