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Analytica Report
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Thin film measurement tool that allows automatic analysis of thin film samples with push button operation. Has an automatic XYZ stage, real-time imaging of the measurement site and automatic selection of spot size. Accessories are available for a wide range of applications.
HORIBA Jobin Yvon SAS
Issue: 20/03
RSN: 067
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Latest Comments
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Rakesh Kanda said More...Dr Alfonso,
Matrix suppression is ... 6 months ago -
Dr Robson JCF Afonso said More...Dear Authors,
As you sad atmospheric... 6 months ago -
Dr Robson JCF Afonso said More...I am glad to hearing someone question... 1 year ago
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Peter Jenks said More...That is a reason I\'d overlooked - po... 1 year ago
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Stephen Boonstoppel said More...I think one of the biggest obstacles ... 1 year ago
Contents Alerts
Popular Techniques
- Atomic absorption
- Atomic emission
- Chemometrics
- ICP-MS
- Imaging
- Infrared
- Ion mobility
- Laser spectroscopy
- Luminescencefluorescence
- Mass spectrometry
- Microscopy
- Mobile
- MRI
- Near infrared
- NMR ESR EPR
- Polarimetry
- Process
- Raman
- Related equipment
- RMs and standards
- Sample prep
- Separation science
- Software
- Surface analysis
- Terahertz
- UVvis
- X-ray spectrometry
Upcoming Events
- 20.05.2012 - 24.05.2012 60th ASMS Conference on Mass ...
- 06.07.2012 - 13.07.2012 12th International Coral Reef ...
- 15.09.2012 - 21.09.2012 19th International Mass Spectr...
- 16.10.2012 - 18.10.2012 Analytica China



