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EDAX adds a new Octane Elect energy dispersive spectroscopy (EDS) system to its existing line of EDS instruments
Princeton Instruments’ SOPHIA-XO:2048 is a high-speed, ultra-low-noise camera
X-ray spectroscopy techniques have some advantages over other atomic spectroscopy techniques in the analysis of foods, for instance in not requiring significant sample preparation. Amongst these, TXRF has higher sensitivity and limits of detection in the ng range. The authors look at the analysis of a number of very different foods, including seafood, honey and vegetables.
X-ray images and XANES reveal battery materials’ chemical reactions in five dimensions: 3D space plus time and energy.
Thermo Scientific have introduced Pathfinder X-ray microanalysis software.
Spectro Analytical Instruments have announced an upgrade of the Spectro xSort handheld X-ray fluorescence (XRF) spectrometer.
Swiss researchers improve an interferometry technique by utilising the interference fringe, an aspect previously viewed as a nuisance, and increase the efficiency of X-ray flux.
An international research team has shown, using XRF that the iron in Tutankhamun’s dagger blade is of meteoritic origin.
Researchers from Leiden and Delft are using Macro X-ray Fluorescence Spectrometry (MA-XRF) to read remains of medieval manuscripts hidden inside the bindings which had been “recycled” after the Middle Ages.
Rigaku’s ZSX Primus IV is a tube-above, wavelength dispersive X-ray fluorscence spectrometer with improved functionality and performance.
Rigaku has published a new application report describing the analysis of low-alloy steel using a benchtop wavelength dispersive X-ray fluorescence (WDXRF) spectrometer.
Spectro have published a white paper explaining why overcoming matrix effects associated with X-ray fluorescence (XRF) analysis is critical to achieving consistent high-accuracy results..
Spectro Analytical Instruments have introduced a new line of Spectro Xepos spectrometers with improved sensitivity.
Andor Technology has introduced the new iKon-XL “open-front” (‘SO’) 16-Megapixel CCD camera platform for vacuum ultraviolet (VUV) and soft X-ray direct detection.
An international group of scientists from Poland, Austria and the UK have used X-ray fluorescence (XRF) spectroscopy at the UK’s Diamond Light Source to advance our understanding of the changes taking place during the progression of brain cancer. This research may lead the way to a new tumour assessment method which could complement traditional approaches.
Raman, FT-IR and ED XRF discover interesting detail of the dying in the 19th century, and maybe about trade links between Europe and Australia.
Rigaku Corporation has announced the next generation NanoHunter II benchtop total reflection X-ray fluorescence (TXRF) spectrometer
The xrFuse range of electric fusion machines from XRF Scientific is available as six-position high-volume and two-position compact models.
A new technique combines electron microscopy and synchrotron x-rays at Brookhaven Lab to track chemical reactions under real operating conditions.
FAST SDD with Moisture Resistant Windows
Amptek’s line of silicon drift detectors is now available for use for energy dispersive spectroscopy (EDS) within scanning electron microscopes (SEMs). With the “C Series” silicon nitride X-ray windows, the low-energy response extends down to boron. SEM-EDS is an ideal application for these detectors because the electrons have a short range in the sample and they excite the X-rays very close to the surface, yielding many X-rays from all the elements down to carbon, benefitting from the high efficiency of these windows at low energies.
Bench-top ED XRF spectrometer suitable for industrial applications, where the 20-position sample tray or automation interface to a conveyor belt will be valuable, or as a flexible tool for the academic and research environment, since it can accept a wide range of sample types, shapes and sizes. The measurement spot can be changed from a couple of centimetres to a few millimetres, and a video camera aids exact sample positioning.
Process XRD system for analysis of polycrystalline material that succeeds the D4 Endeavor. 1-dimensional detector technology enables short measurement times whilst maintaining sensitivity for the detection of crystallographic phases with low concentrations. Conveyor belt or external robot interface are available for automated sample loading, and measurement can continue whilst single samples or sample trays are loaded manually.
ED XRF spectrometer that enables high-sensitivity analyses to be performed across the entire energy range using a maximum of nine types of filters and a sample chamber vacuum unit. It has a 12-position auto sample changer, touch screen operation, pre-recorded recipes for standard solution applications (RoHS, metals, oxides, organic materials), a high sensitivity SDD and short-path optical system for high throughput, and residual balance and thickness correction for organic samples.
Fusion system for making beads for XRF analysis that incorporates a loss-on-ignition (LOI) analyser. An external balance weighs the crucible, sample and flux, and an internal balance below the furnace that is used for LOI calculations. This simplifies the bead making process and makes it less dependent on the individual operator. Versions are available to handle form two to eight beads, and expansion is easily.
X-ray fluorescence spectrometer that has both wavelength dispersive and energy dispersive cores integrated by SumXcore technology in one instrument, which can also include a small spot analysis tool for fast element distribution mapping and the THETA free lime channel for dedicated cement applications. Measuring ED and WD simultaneously cuts the experimental time in half. A series of dedicated Zetium editions are available: cement, polymers, petro, metals and minerals, as well as an “Ultimate” edition. Each is available with a choice of four enhanced performance packages for improved speed and throughput, performance enhancement, robustness and uptime, and flexibility.
New detector for X-ray diffraction with resolution comparable to the PIXcel3D and with pixel dimensions of 60 × 60 µm and overall sensor dimension of 30.7 × 24.8 mm. The CdTe sensor provides high stopping power for X-rays, improving the detector efficiency for all laboratory wavelengths, and enabling close to 100% efficiency for higher radiation such as Ag and Mo.
NEX QC Quant EZ Series
Low-cost, high-resolution bench-top ED XRF analysers designed for heavy industrial use. QuantEZ analytical software runs on either a laptop or benchtop PC and offers all the functions required for calibration and routine maintenance. The NEX QC QuantEZ version is optimised for routine QC and the NEX QC+ QuantEZ version for more demanding applications where analysis time and sample throughput are important. The QC+ uses silicon drift detector technology.