A complication and barrier to wider uptake of SIMS, especially for organic materials, is the complexity of the mass spectrum. The G-SIMS method (from gentle-SIMS) was developed to simplify the spectra and provide direct interpretation based on the physics and chemistry of the SIMS process rather than on statistical analysis techniques such as principal component analysis or library matching methods.
Secondary neutral mass spectrometry—a powerful technique for quantitative elemental and depth profiling analyses of nanostructures
Kálmán Vad,a Attila Csika and Gábor A. LangerbaInstitute of Nuclear Research, Hungarian Academy of Sciences, H-4001 Debrecen, PO Box 51, Hungary. E-mail: firstname.lastname@example.org; web: http://www.atomki.hu/SNMSbDepartment of Solid State Physics, University of Debrecen, H-4010 Debrecen, PO Box 2, Hungary
The decrease of dimensions and increasing complexity of thin-film and multilayer structures require the application of methods that provide information down to the nanometre scale. The quantification of nanostructures and surface layers with high sensitivity is often of crucial importance in monitoring product quality. Sensitive elemental analysis, together with a quantitative chemical analysis, is a prerequisite for the preparation of thin-layer structures of good quality.
John WaltonSurface Analysis Coordinator, School of Materials, The University of Manchester, PO Box 88, Manchester, M60 1QD, UK. E-mail: email@example.com, Web: personalpages.manchester.ac.uk/staff/john.walton
Since the interaction between solid materials and their surrounding media, whether gaseous or liquid, occurs at the surface, analytical techniques capable of providing information from the interaction region are fundamental in understanding the processes that are occurring. X-ray Photoelectron Spectroscopy (XPS) is one such technique, and is capable of analysing both conducting and insulating materials.
John F. WattsSurrey Materials Institute and School of Engineering, University of Surrey, Guildford, Surrey GU2 7XH, UK. E-mail: firstname.lastname@example.org
Alan J. PaulCSMA, CERAM, Queens Road, Stoke-on-Trent, ST4 7LQ, UK
Study of annatto from Bixa orellana seeds: an application of time-of-flight secondary ion mass spectrometry
Carla Bittencourt, Marcella P. Felicissimo, Jean-Jacques Pireaux and Laurent HoussiauLaboratoire Interdisciplinaire de Spectroscopie Electronique (LISE), Facultés Universitaires Notre-Dame de la Paix, University of Namur, 61 rue de Bruxelles, B-5000 Namur, Belgium
Frank Rutten,* Julian Hendersona and David BriggsSchool of Pharmacy and Centre for Surface Chemical Analysis,aDepartment of Archaeology, School of Humanities, University of Nottingham, University Park, Nottingham NG7 2RD, UK*Correspondence to: Frank Rutten, School of Pharmacy, University of Nottingham University Park, Nottingham NG7 2RD, UK. E-mail: email@example.com
Antonella Rossi,a,b Bernhard Elsenera and Nicholas D. SpencerbaDepartment of Inorganic and Analytical Chemistry, University of Cagliari, Campus of Monserrato, 09100 Cagliari, ItalybLaboratory for Surface Science and Technology, Department of Materials, ETH-Hönggerberg, Wolfgang-Pauli-Strasse 10, CH-8093 Zürich, Switzerland.E-mail: firstname.lastname@example.org, email@example.com; http://dipcia.unica.it/superf/ and http://www.surface.mat.ethz.ch
S.Y. Luk,a N. Patela and M.C. DaviesbaMolecular Profiles Ltd, 1 Faraday Building, Nottingham Science & Technology Park, University Boulevard, Nottingham NG7 2QP, UK. E-mail: firstname.lastname@example.orgLaboratory of Biophysics and Surface Analysis, School of Pharmaceutical Sciences, University of Nottingham, Nottingham NG7 2RD, UK