The new MAXIM SIMS/SNMS work­station from Hiden Analytical combines high-sensitivity surface measurement by both secondary ion and sputtered neutral mass spectrometry. The system is suited to both static and dynamic measurement and is fully UHV compliant with a choice of oxygen, argon and caesium ion sources for broad-beam applications and for fine-focus operation to 20 µm spot size. The workstation is configured to accept diverse sample types and, together with the in-built elemental surface imaging program, provides for quantitative analysis of surface composition and/or depth profile features.

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