If you're attending Pittcon, come and see us on booth 3821.
PANalytical has extended the compatibility of its Omnian standardless analysis software to include the benchtop MiniPal 4 XRF spectrometer. This combination provides quantification of unknowns in situations where certified standards are not available. Omnian provides elemental analysis of all materials no matter how they have been prepared. Typical applications include rapid screening, comparative analysis and R&D investigations.
PANalytical has launched CubiX3, the 3rd generation of its CubiX X-ray powder diffractometers range. The CubiX3 introduces new features such as high-intensity data collection as well as extra flexibility in sample handling for automated environments. XRD has already reached significant importance as a process and production control method for powdered materials in many industries. The Walk-Up software available for CubiX3 enables a user with no knowledge of XRD to enter urgent samples at any time, even if the diffractometer is already processing a routine batch; and automatically receive a report of results with no user input to the analysis.
The Eagon 2 system from PANalytical brings the advantages of a high performance, fully automated fusion instrument for fused bead sample preparation to all users of XRF spectrometry. The patent-pending design combines all the advantages of gas burner and muffle furnace technology in a system that does not require gas supplies, cooling water or compressed air; just a simple electrical connection. Preparation conditions are optimised for all sample materials, and a pre-defined method library is provided. A “cold-to-cold” operation cycle protects users from hot materials and surfaces at all times. In addition, the instrument’s outer doors are safety interlocked throughout the fusion cycle to shield operators from moving parts.
PANalytical has launched the Empyrean high-performance diffractometer which includes a 3D detection system, PIXcel3D. It can measure all sample types—from powders to thin films, from nanomaterials to 3D objects—on a single instrument. The new 3D capabilities enables the internal structure of solid objects to be studied without having to be cut. The PIXcel3D detector can be used as a CT scanner allowing non-destructive analysis of pharmaceutical formulations (tablets, capsules), electronic components (batteries, ICs, capacitors) and geo- and archaeological samples, to name a few.
Agilent Technologies have introduced the 5975T Low Thermal Mass (LTM) gas chromatography/mass spectrometry detector (GC/MSD), that provides laboratory-quality analysis. The proprietary LTM technology has enabled the 5975T LTM to be smaller, more rugged and to consume less power than in-lab GC/MS instruments, yet capable of the same performance in the field. The LTM technology eliminates the conventional GC oven by wrapping the GC column(s) with a heating element and temperature sensor. This provides rapid heating and cooling of the column for higher throughput.
Agilent Technologies have introduced the Agilent 6150B Series single quadrupole LC/MS, a new generation of their workhorse instrument. The 6150B Series LC/MS is well-matched to the latest fast chromatography systems, able to scan at 10,000 amu per second, while maintaining data quality. It is equipped with Agilent Jet Stream Technology, a sample inlet design that uses super-heated sheath gas to focus the ion stream entering the mass spec. The benefit is enhanced sensitivity from a stronger signal with lower relative standard deviation at the limit of detection.
- Ken Kempfert of Pike Technologies describes their latest FT-IR accessories
- Willi Barger of Spectro describes their new ICP-MS
- Martijn Fransen, PANalytical
- Simon Nunn, Marketing Manager, Thermo Molecular Spectroscopy
- FVS-6000 VCD spectrometer and VFT-4000 VCD accessory
- NRS-5000/7000 Series Raman spectrometers
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- Atomic absorption
- Atomic emission
- Ion mobility
- Laser spectroscopy
- Mass spectrometry
- Near infrared
- NMR ESR EPR
- Related equipment
- RMs and standards
- Sample prep
- Separation science
- Surface analysis
- X-ray spectrometry